{"id":1133,"date":"2024-06-27T15:29:45","date_gmt":"2024-06-27T07:29:45","guid":{"rendered":"https:\/\/material.eng.usm.my\/strategicminerals\/?p=1133"},"modified":"2024-06-27T15:52:43","modified_gmt":"2024-06-27T07:52:43","slug":"list-of-equipment","status":"publish","type":"post","link":"https:\/\/material.eng.usm.my\/strategicminerals\/?p=1133","title":{"rendered":"List of Equipment"},"content":{"rendered":"\n
1. Characterization Equipment<\/strong><\/h6>\n\n\n\n
Equipment<\/th>Function<\/th>Principle<\/th><\/tr><\/thead>
BRUKER D8 ADVANCE<\/td>X-ray diffraction (XRD) analysis<\/td>Higher performance and precision, suited for advanced applications<\/td><\/tr>
BRUKER D2 PHASE<\/td>X-ray diffraction (XRD) analysis<\/td>Compact and portable, suitable for routine analysis<\/td><\/tr>
PHILIPS PANALYTICAL MINIPAL 4<\/td>X-ray fluorescence (XRF) spectrometry<\/td>Bench-top XRF analyzer for routine elemental analysis<\/td><\/tr>
XRF RIGAKU RIX 3000<\/td>X-ray fluorescence (XRF) spectrometry<\/td>High-power XRF analyzer for more demanding applications<\/td><\/tr>
ATOMIC ABSORPTION SPECTROMETER (AAS), PERKIN ELMER, AANALYST 700<\/td>Elemental analysis using atomic absorption spectrometry
<\/td>		High-sensitivity elemental analysis<\/td><\/tr>
UV-VISIBLE SPECTROPHOTOMETER, PERKIN ELMER, LAMBDA 35<\/td>UV-Vis spectrophotometry (absorbance and transmittance measurements)<\/td>High-precision UV-Vis analysis<\/td><\/tr>
UV-VISIBLE SPECTROPHOTOMETER, VARIAN CARY, 50 CONC<\/td>UV-Vis spectrophotometry (absorbance and transmittance measurements)<\/td>UV-Vis analysis<\/td><\/tr>
INDUCTIVELY COUPLED PLASMA-OPTICAL EMISSION SPECTROMETRY (ICP-OES), PERKIN ELMER, OPTIMA 7300DV<\/td>Elemental analysis using ICP-OES<\/td>High-sensitivity, multi-element analysis<\/td><\/tr><\/tbody><\/table><\/figure>\n\n\n\n
2. Microscopy<\/strong><\/h6>\n\n\n\n
Equipment<\/th>Function<\/th>Principle<\/th><\/tr><\/thead>
FESEM ZEISS SUPRA 35 VP<\/td>Field Emission Scanning Electron Microscopy (FESEM)<\/td>High-resolution imaging of sample surfaces<\/td><\/tr>
OPTICAL MICROSCOPE<\/td>General optical microscopy<\/td>Basic optical analysis of samples<\/td><\/tr>
SEM HITACHI TM3000<\/td>Scanning Electron Microscopy (SEM)<\/td>Desktop SEM for easy, routine imaging<\/td><\/tr>
POLARIZING MICROSCOPE AXIASKOP CARL ZEISS 40<\/td>Polarized light microscopy<\/td>Advanced polarizing microscope for detailed mineralogical studies<\/td><\/tr>
METALLURGICAL MICROSCOPE OLYMPUS BX51M<\/td>Metallurgical microscopy<\/td>High-end microscope for detailed analysis of metal samples<\/td><\/tr>
POLARIZING MICROSCOPE MEIJI WITH IMAGE ANALYSER SOFTWARE<\/td>Polarized light microscopy with image analysis<\/td>Combines polarization and digital imaging for detailed studies<\/td><\/tr>
METALLURGICAL MICROSCOPE MEIJI WITH IMAGE ANALYSER SOFTWARE<\/td>Metallurgical microscopy with image analysis<\/td>High-resolution imaging with metallurgical focus<\/td><\/tr>
STEREO ZOOM MICROSCOPE KUNOH ROBO<\/td>Stereo zoom microscopy<\/td>High-precision stereo zoom for 3D viewing of samples<\/td><\/tr>
METALLURGICAL MICROSCOPE RAX VISION<\/td>Metallurgical microscopy<\/td>Designed specifically for metallurgical applications<\/td><\/tr>
STEREO ZOOM MICROSCOPE LEICA<\/td>Stereo zoom microscopy<\/td>High-quality optics for detailed 3D imaging<\/td><\/tr>
DIGITAL MICROSCOPY IMAGE ANALYSER XOPTRON X80POL<\/td>Digital microscopy with image analysis<\/td>High-resolution digital imaging and analysis<\/td><\/tr>
POLARIZING MICROSCOPE JENALAB<\/td>Polarized light microscopy<\/td>High-quality polarizing optics for detailed mineralogical studies<\/td><\/tr>
SMALL POLARIZING MICROSCOPE ZEISS<\/td>Polarized light microscopy<\/td>Compact, high-resolution polarizing microscope<\/td><\/tr>
POLARIZING MICROSCOPE MEIJI<\/td>Polarized light microscopy<\/td>General-purpose polarizing microscope<\/td><\/tr>
AXIOSTAR MICROSCOPE ZEISS<\/td>General microscopy<\/td>Versatile microscope for a wide range of applications<\/td><\/tr>
STEREO ZOOM MICROSCOPE OLYMPUS<\/td>Stereo zoom microscopy<\/td>Precision stereo zoom optics for detailed examination<\/td><\/tr>
STEREO ZOOM MICROSCOPE ZEISS<\/td>Stereo zoom microscopy<\/td>High-quality stereo zoom for detailed 3D imaging<\/td><\/tr>
POLARIZING MICROSCOPE OLYMPUS BX41<\/td>Polarized light microscopy<\/td>High-resolution polarizing microscope for advanced studies<\/td><\/tr>
SCANNING PROBE MICROSCOPE (AFM)
<\/td>		Atomic force microscopy for surface analysis<\/td>High-resolution surface analysis<\/td><\/tr><\/tbody><\/table><\/figure>\n\n\n\n
3. Thermal Analysis<\/strong><\/h6>\n\n\n\n
Equipment<\/th>Function<\/th>Principle<\/th><\/tr><\/thead>
TG-DTA LENSIES<\/td>Thermogravimetric Analysis (TGA) and Differential Thermal Analysis (DTA)<\/td>Combined TGA and DTA for comprehensive thermal analysis<\/td><\/tr>
DIFFERENTIAL THERMAL ANALYSER\/THERMOGRAVIMETRY METTLER TOLEDO<\/td>Thermal analysis of materials<\/td>High-precision thermal analysis<\/td><\/tr>
DIFFERENTIAL THERMAL ANALYSER\/THERMOGRAVIMETRY SETARAM<\/td>Thermal analysis of materials<\/td>Advanced thermal analysis with high sensitivity<\/td><\/tr><\/tbody><\/table><\/figure>\n\n\n\n
4. Particle Size Analysis<\/strong><\/h6>\n\n\n\n
Equipment<\/th>Function<\/th>Principle<\/th><\/tr><\/thead>
CYCLOSIZER<\/td>Particle size analysis for fine particles<\/td>Specialized for fine particle analysis<\/td><\/tr>
PARTICLE SIZE ANALYSER MALVERN MS3000<\/td>Particle size analysis<\/td>High-precision particle size distribution analysis<\/td><\/tr>
SIEVE SHAKER<\/td>Particle size distribution analysis using sieves<\/td>Basic mechanical sieving for particle size distribution<\/td><\/tr>
SIEVE SHAKER ENDECOTTS<\/td>Particle size distribution analysis using sieves<\/td>Precision mechanical sieving<\/td><\/tr>
SIEVE SHAKER GILSON<\/td>Particle size distribution analysis using sieves<\/td>High-capacity mechanical sieving<\/td><\/tr>
ZETASIZER, MALVERN, NANO SERIES<\/td>Particle size and zeta potential analysis
<\/td>		High-precision nano-particle analysis<\/td><\/tr><\/tbody><\/table><\/figure>\n\n\n\n
5. Separation and Concentration<\/strong><\/h6>\n\n\n\n
Equipment<\/th>Function<\/th>Principle<\/th><\/tr><\/thead>
HUMPREY SPIRAL<\/td>Gravity separation of fine particles<\/td>Efficient spiral separator for fine mineral recovery<\/td><\/tr>
HIDROCYCLONE<\/td>Separation of particles in liquid suspension<\/td>Effective for classifying and dewatering slurries<\/td><\/tr>
JAMESON FLOTATION CELL<\/td>Froth flotation for separating minerals<\/td>High-efficiency flotation cell<\/td><\/tr>
ECCENTRIC JIGS<\/td>Jigging for mineral separation<\/td>Effective for gravity separation based on density<\/td><\/tr>
SHAKING TABLE<\/td>Gravity separation using a shaking table<\/td>High-precision table for fine mineral recovery<\/td><\/tr>
MOZLEY TABLE<\/td>Gravity separation for fine particles<\/td>Specialized for fine particle recovery<\/td><\/tr>
KNELSON CONCENTRATOR<\/td>Centrifugal gravity concentration for minerals<\/td>Efficient for fine gold recovery<\/td><\/tr>
HIGH FORCE EDDY CURRENT SEPARATOR<\/td>Separation of conductive materials using eddy currents<\/td>Effective for non-ferrous metal recovery<\/td><\/tr>
HIGH TENTION MAGNETIC SEPARATOR<\/td>Separation of magnetic materials<\/td>High-efficiency magnetic separator<\/td><\/tr>
MAGNETIC SEPARATOR HIGH INTENS<\/td>High-intensity magnetic separation<\/td>Specialized for high-intensity separation<\/td><\/tr>
RARE EARTH HIGH FORCE MAGNETIC SEPARATOR<\/td>High-force magnetic separation using rare earth magnets<\/td>Extremely strong magnetic separation<\/td><\/tr><\/tbody><\/table><\/figure>\n\n\n\n
6. Testing and Measurement<\/strong><\/h6>\n\n\n\n
Equipment<\/th>Function<\/th>Principle<\/th><\/tr><\/thead>
ROCKWELL HARDNESS<\/td>Hardness testing using the Rockwell scale<\/td>Standard hardness testing<\/td><\/tr>
UNIVERSAL TESTING MACHINE 100KN<\/td>Mechanical testing of materials up to 100 kN<\/td>Suitable for routine mechanical tests<\/td><\/tr>
CREEP TESTER<\/td>Testing long-term deformation under constant load<\/td>Specific for creep testing<\/td><\/tr>
UNIVERSAL TESTING MACHINE 500KN<\/td>Mechanical testing of materials up to 500 kN<\/td>Higher capacity for larger samples<\/td><\/tr>
UNIVERSAL TESTING MACHINE INSTRON 8501<\/td>Mechanical testing of materials<\/td>Advanced features for comprehensive testing<\/td><\/tr>
SPLIT HOPKIN PRESSURE BAR<\/td>Measuring dynamic stress-strain response<\/td>High-speed dynamic testing<\/td><\/tr>
MICROHARDNESS (LECO)<\/td>Microhardness testing<\/td>Suitable for small-scale hardness testing<\/td><\/tr>
VICKERS HARDNESS (FUTURE TECH -[MACRO])<\/td>Vickers hardness testing<\/td>Macro-scale hardness testing<\/td><\/tr>
BRINELL HARDNESS TESTERS (GERMANY)<\/td>Brinell hardness testing<\/td>Standard Brinell hardness testing<\/td><\/tr>
BRINELL HARDNESS TESTERS (NEWAGE)<\/td>Brinell hardness testing<\/td>Advanced Brinell hardness testing<\/td><\/tr>
IMPACT TESTER (GALDABINI)<\/td>Testing impact resistance of materials<\/td>High-precision impact testing<\/td><\/tr>
IMPACT TESTER (TMI)<\/td>Testing impact resistance of materials<\/td>Standard impact testing<\/td><\/tr>
NOTCH MAKER<\/td>Creating notches in samples for fracture testing<\/td>Specialized for preparing samples for impact tests<\/td><\/tr>
POINT LOAD TEST DIGITAL<\/td>Point load testing for rock strength<\/td>Digital precision testing<\/td><\/tr>
POINT LOAD TEST<\/td>Point load testing for rock strength<\/td>Standard point load testing<\/td><\/tr>
CONE PENETROMETER<\/td>Testing soil penetration resistance<\/td>Suitable for soil and soft rock testing<\/td><\/tr>
AGGREGATE IMPACT VALUE<\/td>Measuring impact resistance of aggregates<\/td>Standard testing for aggregates<\/td><\/tr>
BET<\/td>Surface area and porosity analysis<\/td>Standard BET analysis<\/td><\/tr>
HALL EFFECT<\/td>Measuring the Hall effect for material properties<\/td>Specific for electrical properties analysis<\/td><\/tr><\/tbody><\/table><\/figure>\n\n\n\n
7. Crushing and Comminution<\/strong><\/h6>\n\n\n\n
Equipment<\/th>Function<\/th>Principle<\/th><\/tr><\/thead>
JAW CRUSHER SVEDALA<\/td>Crushing large samples into smaller pieces<\/td>Suitable for coarse crushing<\/td><\/tr>
CONE CRUSHER<\/td>Crushing materials into smaller, more uniform pieces<\/td>Suitable for secondary crushing<\/td><\/tr>
JAW CRUSHER (KECIL)<\/td>Crushing smaller samples<\/td>Compact crusher for small samples<\/td><\/tr>
HARD ROCK CUTTER<\/td>Cutting hard rock samples<\/td>High-precision cutting for hard rock samples<\/td><\/tr>
HORIZONTAL BAND SAW<\/td>Cutting core samples and large rock specimens<\/td>Versatile saw for large samples<\/td><\/tr>
CORE DRILL<\/td>Drilling core samples from larger materials<\/td>Extracting cylindrical core samples for analysis<\/td><\/tr><\/tbody><\/table><\/figure>\n\n\n\n
8. Grinding and Milling<\/strong><\/h6>\n\n\n\n
Equipment<\/th>Function<\/th>Principle<\/th><\/tr><\/thead>
STIRRED MILL<\/td>Fine and ultrafine grinding<\/td>Efficient for ultrafine grinding<\/td><\/tr>
DIAMOND GRINDABILITY MILL<\/td>Grinding hard materials<\/td>Specialized for grinding extremely hard materials<\/td><\/tr>
PLANETARY MILL RETSCH PM1000<\/td>High-energy ball milling<\/td>High-capacity milling<\/td><\/tr>
PLANETARY MILL FRITSCH P5<\/td>High-energy ball milling<\/td>Precision milling<\/td><\/tr>
PLANETARY MILL FRITSCH P6<\/td>High-energy ball milling<\/td>Compact, efficient milling<\/td><\/tr>
RING MILL<\/td>Grinding samples to fine powder<\/td>Effective for producing fine powders<\/td><\/tr>
MILLING MACHINE<\/td>Precision machining of materials<\/td>Versatile machining for various materials<\/td><\/tr><\/tbody><\/table><\/figure>\n\n\n\n
9. Sample Preparation<\/strong><\/h6>\n\n\n\n
Equipment<\/th>Function<\/th>Principle<\/th><\/tr><\/thead>
MICRACUT 125 LOW SPEED PRECISION SAW<\/td>Precision cutting of materials<\/td>Low-speed precision cutting for minimal damage<\/td><\/tr>
CUTTER MICRACUT<\/td>Cutting materials<\/td>General-purpose cutting<\/td><\/tr>
POLISHING MACHINE METKON<\/td>Polishing samples for microscopy<\/td>High-quality polishing for microscopy<\/td><\/tr>
POLISHING MACHINE UNI POL-830<\/td>Polishing samples for microscopy<\/td>Advanced polishing with variable speed<\/td><\/tr>
HOT MOUNTING MACHINE IMPTECH M 10<\/td>Hot mounting samples for microscopy<\/td>Compact, efficient hot mounting<\/td><\/tr>
HOT MOUNTING ECO PRESS 100<\/td>Hot mounting samples for microscopy<\/td>Eco-friendly, efficient mounting<\/td><\/tr>
POLISHING MACHINE IMPTECH<\/td>Polishing samples for microscopy<\/td>Versatile polishing machine<\/td><\/tr>
POLISHING MACHINE MINITECH Z63<\/td>Polishing samples for microscopy<\/td>Advanced polishing for detailed analysis<\/td><\/tr>
ABRASIVE CUTTER<\/td>Cutting materials with abrasive wheels<\/td>Suitable for hard materials<\/td><\/tr>
DIAMOND CUTTER<\/td>Precision cutting using diamond blades<\/td>High-precision cutting for hard materials<\/td><\/tr><\/tbody><\/table><\/figure>\n\n\n\n
10. Auxiliary Equipment<\/strong><\/h6>\n\n\n\n
Equipment<\/th>Function<\/th>Principle<\/th><\/tr><\/thead>
ULTRASONIC CLEANER SONO-SWISS<\/td>Ultrasonic cleaning of samples<\/td>High-frequency cleaning for delicate samples<\/td><\/tr>
OVEN<\/td>Heating and drying samples<\/td>Standard drying and heating<\/td><\/tr>
DIGITAL BALANCE<\/td>Weighing samples<\/td>High-precision weighing<\/td><\/tr>
TOP PAN BALANCE<\/td>Weighing samples<\/td>Suitable for larger samples<\/td><\/tr>
CENTRIFUGE ROTOFIX 32 A<\/td>Centrifugation for sample separation<\/td>Efficient sample separation<\/td><\/tr>
CENTRIFUGE, KUBOTA, 2010<\/td>Centrifugation for sample separation<\/td>Versatile centrifuge for various applications<\/td><\/tr>
OVERHEAD SHAKER, HEIDOLPH, REAX 2<\/td>Shaking samples for mixing<\/td>Efficient mixing<\/td><\/tr>
MICROBALANCE (MAX 5.1G), SARTORIOUS, MC 5<\/td>High-precision weighing of small samples<\/td>Extremely high-precision weighing<\/td><\/tr>
ORBITAL SHAKER, SCILOGEX, SCI-O330-PRO<\/td>Orbital shaking for sample mixing<\/td>Effective orbital mixing<\/td><\/tr><\/tbody><\/table><\/figure>\n","protected":false},"excerpt":{"rendered":"

1. Characterization Equipment Equipment Function Principle BRUKER D8 ADVANCE X-ray diffraction (XRD) analysis Higher performance and precision, suited for advanced applications BRUKER D2 PHASE X-ray diffraction (XRD) analysis Compact and portable, suitable for routine analysis PHILIPS PANALYTICAL MINIPAL 4 X-ray fluorescence (XRF) spectrometry Bench-top XRF analyzer for routine elemental analysis XRF RIGAKU RIX 3000 X-ray…<\/p>\n","protected":false},"author":3,"featured_media":1156,"comment_status":"closed","ping_status":"closed","sticky":false,"template":"","format":"standard","meta":{"footnotes":""},"categories":[44],"tags":[],"class_list":["post-1133","post","type-post","status-publish","format-standard","has-post-thumbnail","hentry","category-our-services"],"_links":{"self":[{"href":"https:\/\/material.eng.usm.my\/strategicminerals\/index.php?rest_route=\/wp\/v2\/posts\/1133","targetHints":{"allow":["GET"]}}],"collection":[{"href":"https:\/\/material.eng.usm.my\/strategicminerals\/index.php?rest_route=\/wp\/v2\/posts"}],"about":[{"href":"https:\/\/material.eng.usm.my\/strategicminerals\/index.php?rest_route=\/wp\/v2\/types\/post"}],"author":[{"embeddable":true,"href":"https:\/\/material.eng.usm.my\/strategicminerals\/index.php?rest_route=\/wp\/v2\/users\/3"}],"replies":[{"embeddable":true,"href":"https:\/\/material.eng.usm.my\/strategicminerals\/index.php?rest_route=%2Fwp%2Fv2%2Fcomments&post=1133"}],"version-history":[{"count":1,"href":"https:\/\/material.eng.usm.my\/strategicminerals\/index.php?rest_route=\/wp\/v2\/posts\/1133\/revisions"}],"predecessor-version":[{"id":1137,"href":"https:\/\/material.eng.usm.my\/strategicminerals\/index.php?rest_route=\/wp\/v2\/posts\/1133\/revisions\/1137"}],"wp:featuredmedia":[{"embeddable":true,"href":"https:\/\/material.eng.usm.my\/strategicminerals\/index.php?rest_route=\/wp\/v2\/media\/1156"}],"wp:attachment":[{"href":"https:\/\/material.eng.usm.my\/strategicminerals\/index.php?rest_route=%2Fwp%2Fv2%2Fmedia&parent=1133"}],"wp:term":[{"taxonomy":"category","embeddable":true,"href":"https:\/\/material.eng.usm.my\/strategicminerals\/index.php?rest_route=%2Fwp%2Fv2%2Fcategories&post=1133"},{"taxonomy":"post_tag","embeddable":true,"href":"https:\/\/material.eng.usm.my\/strategicminerals\/index.php?rest_route=%2Fwp%2Fv2%2Ftags&post=1133"}],"curies":[{"name":"wp","href":"https:\/\/api.w.org\/{rel}","templated":true}]}}