1. Characterization Equipment
| Equipment | Function | Principle |
|---|---|---|
| BRUKER D8 ADVANCE | X-ray diffraction (XRD) analysis | Higher performance and precision, suited for advanced applications |
| BRUKER D2 PHASE | X-ray diffraction (XRD) analysis | Compact and portable, suitable for routine analysis |
| PHILIPS PANALYTICAL MINIPAL 4 | X-ray fluorescence (XRF) spectrometry | Bench-top XRF analyzer for routine elemental analysis |
| XRF RIGAKU RIX 3000 | X-ray fluorescence (XRF) spectrometry | High-power XRF analyzer for more demanding applications |
| ATOMIC ABSORPTION SPECTROMETER (AAS), PERKIN ELMER, AANALYST 700 | Elemental analysis using atomic absorption spectrometry | High-sensitivity elemental analysis |
| UV-VISIBLE SPECTROPHOTOMETER, PERKIN ELMER, LAMBDA 35 | UV-Vis spectrophotometry (absorbance and transmittance measurements) | High-precision UV-Vis analysis |
| UV-VISIBLE SPECTROPHOTOMETER, VARIAN CARY, 50 CONC | UV-Vis spectrophotometry (absorbance and transmittance measurements) | UV-Vis analysis |
| INDUCTIVELY COUPLED PLASMA-OPTICAL EMISSION SPECTROMETRY (ICP-OES), PERKIN ELMER, OPTIMA 7300DV | Elemental analysis using ICP-OES | High-sensitivity, multi-element analysis |
2. Microscopy
| Equipment | Function | Principle |
|---|---|---|
| FESEM ZEISS SUPRA 35 VP | Field Emission Scanning Electron Microscopy (FESEM) | High-resolution imaging of sample surfaces |
| OPTICAL MICROSCOPE | General optical microscopy | Basic optical analysis of samples |
| SEM HITACHI TM3000 | Scanning Electron Microscopy (SEM) | Desktop SEM for easy, routine imaging |
| POLARIZING MICROSCOPE AXIASKOP CARL ZEISS 40 | Polarized light microscopy | Advanced polarizing microscope for detailed mineralogical studies |
| METALLURGICAL MICROSCOPE OLYMPUS BX51M | Metallurgical microscopy | High-end microscope for detailed analysis of metal samples |
| POLARIZING MICROSCOPE MEIJI WITH IMAGE ANALYSER SOFTWARE | Polarized light microscopy with image analysis | Combines polarization and digital imaging for detailed studies |
| METALLURGICAL MICROSCOPE MEIJI WITH IMAGE ANALYSER SOFTWARE | Metallurgical microscopy with image analysis | High-resolution imaging with metallurgical focus |
| STEREO ZOOM MICROSCOPE KUNOH ROBO | Stereo zoom microscopy | High-precision stereo zoom for 3D viewing of samples |
| METALLURGICAL MICROSCOPE RAX VISION | Metallurgical microscopy | Designed specifically for metallurgical applications |
| STEREO ZOOM MICROSCOPE LEICA | Stereo zoom microscopy | High-quality optics for detailed 3D imaging |
| DIGITAL MICROSCOPY IMAGE ANALYSER XOPTRON X80POL | Digital microscopy with image analysis | High-resolution digital imaging and analysis |
| POLARIZING MICROSCOPE JENALAB | Polarized light microscopy | High-quality polarizing optics for detailed mineralogical studies |
| SMALL POLARIZING MICROSCOPE ZEISS | Polarized light microscopy | Compact, high-resolution polarizing microscope |
| POLARIZING MICROSCOPE MEIJI | Polarized light microscopy | General-purpose polarizing microscope |
| AXIOSTAR MICROSCOPE ZEISS | General microscopy | Versatile microscope for a wide range of applications |
| STEREO ZOOM MICROSCOPE OLYMPUS | Stereo zoom microscopy | Precision stereo zoom optics for detailed examination |
| STEREO ZOOM MICROSCOPE ZEISS | Stereo zoom microscopy | High-quality stereo zoom for detailed 3D imaging |
| POLARIZING MICROSCOPE OLYMPUS BX41 | Polarized light microscopy | High-resolution polarizing microscope for advanced studies |
| SCANNING PROBE MICROSCOPE (AFM) | Atomic force microscopy for surface analysis | High-resolution surface analysis |
3. Thermal Analysis
| Equipment | Function | Principle |
|---|---|---|
| TG-DTA LENSIES | Thermogravimetric Analysis (TGA) and Differential Thermal Analysis (DTA) | Combined TGA and DTA for comprehensive thermal analysis |
| DIFFERENTIAL THERMAL ANALYSER/THERMOGRAVIMETRY METTLER TOLEDO | Thermal analysis of materials | High-precision thermal analysis |
| DIFFERENTIAL THERMAL ANALYSER/THERMOGRAVIMETRY SETARAM | Thermal analysis of materials | Advanced thermal analysis with high sensitivity |
4. Particle Size Analysis
| Equipment | Function | Principle |
|---|---|---|
| CYCLOSIZER | Particle size analysis for fine particles | Specialized for fine particle analysis |
| PARTICLE SIZE ANALYSER MALVERN MS3000 | Particle size analysis | High-precision particle size distribution analysis |
| SIEVE SHAKER | Particle size distribution analysis using sieves | Basic mechanical sieving for particle size distribution |
| SIEVE SHAKER ENDECOTTS | Particle size distribution analysis using sieves | Precision mechanical sieving |
| SIEVE SHAKER GILSON | Particle size distribution analysis using sieves | High-capacity mechanical sieving |
| ZETASIZER, MALVERN, NANO SERIES | Particle size and zeta potential analysis | High-precision nano-particle analysis |
5. Separation and Concentration
| Equipment | Function | Principle |
|---|---|---|
| HUMPREY SPIRAL | Gravity separation of fine particles | Efficient spiral separator for fine mineral recovery |
| HIDROCYCLONE | Separation of particles in liquid suspension | Effective for classifying and dewatering slurries |
| JAMESON FLOTATION CELL | Froth flotation for separating minerals | High-efficiency flotation cell |
| ECCENTRIC JIGS | Jigging for mineral separation | Effective for gravity separation based on density |
| SHAKING TABLE | Gravity separation using a shaking table | High-precision table for fine mineral recovery |
| MOZLEY TABLE | Gravity separation for fine particles | Specialized for fine particle recovery |
| KNELSON CONCENTRATOR | Centrifugal gravity concentration for minerals | Efficient for fine gold recovery |
| HIGH FORCE EDDY CURRENT SEPARATOR | Separation of conductive materials using eddy currents | Effective for non-ferrous metal recovery |
| HIGH TENTION MAGNETIC SEPARATOR | Separation of magnetic materials | High-efficiency magnetic separator |
| MAGNETIC SEPARATOR HIGH INTENS | High-intensity magnetic separation | Specialized for high-intensity separation |
| RARE EARTH HIGH FORCE MAGNETIC SEPARATOR | High-force magnetic separation using rare earth magnets | Extremely strong magnetic separation |
6. Testing and Measurement
| Equipment | Function | Principle |
|---|---|---|
| ROCKWELL HARDNESS | Hardness testing using the Rockwell scale | Standard hardness testing |
| UNIVERSAL TESTING MACHINE 100KN | Mechanical testing of materials up to 100 kN | Suitable for routine mechanical tests |
| CREEP TESTER | Testing long-term deformation under constant load | Specific for creep testing |
| UNIVERSAL TESTING MACHINE 500KN | Mechanical testing of materials up to 500 kN | Higher capacity for larger samples |
| UNIVERSAL TESTING MACHINE INSTRON 8501 | Mechanical testing of materials | Advanced features for comprehensive testing |
| SPLIT HOPKIN PRESSURE BAR | Measuring dynamic stress-strain response | High-speed dynamic testing |
| MICROHARDNESS (LECO) | Microhardness testing | Suitable for small-scale hardness testing |
| VICKERS HARDNESS (FUTURE TECH -[MACRO]) | Vickers hardness testing | Macro-scale hardness testing |
| BRINELL HARDNESS TESTERS (GERMANY) | Brinell hardness testing | Standard Brinell hardness testing |
| BRINELL HARDNESS TESTERS (NEWAGE) | Brinell hardness testing | Advanced Brinell hardness testing |
| IMPACT TESTER (GALDABINI) | Testing impact resistance of materials | High-precision impact testing |
| IMPACT TESTER (TMI) | Testing impact resistance of materials | Standard impact testing |
| NOTCH MAKER | Creating notches in samples for fracture testing | Specialized for preparing samples for impact tests |
| POINT LOAD TEST DIGITAL | Point load testing for rock strength | Digital precision testing |
| POINT LOAD TEST | Point load testing for rock strength | Standard point load testing |
| CONE PENETROMETER | Testing soil penetration resistance | Suitable for soil and soft rock testing |
| AGGREGATE IMPACT VALUE | Measuring impact resistance of aggregates | Standard testing for aggregates |
| BET | Surface area and porosity analysis | Standard BET analysis |
| HALL EFFECT | Measuring the Hall effect for material properties | Specific for electrical properties analysis |
7. Crushing and Comminution
| Equipment | Function | Principle |
|---|---|---|
| JAW CRUSHER SVEDALA | Crushing large samples into smaller pieces | Suitable for coarse crushing |
| CONE CRUSHER | Crushing materials into smaller, more uniform pieces | Suitable for secondary crushing |
| JAW CRUSHER (KECIL) | Crushing smaller samples | Compact crusher for small samples |
| HARD ROCK CUTTER | Cutting hard rock samples | High-precision cutting for hard rock samples |
| HORIZONTAL BAND SAW | Cutting core samples and large rock specimens | Versatile saw for large samples |
| CORE DRILL | Drilling core samples from larger materials | Extracting cylindrical core samples for analysis |
8. Grinding and Milling
| Equipment | Function | Principle |
|---|---|---|
| STIRRED MILL | Fine and ultrafine grinding | Efficient for ultrafine grinding |
| DIAMOND GRINDABILITY MILL | Grinding hard materials | Specialized for grinding extremely hard materials |
| PLANETARY MILL RETSCH PM1000 | High-energy ball milling | High-capacity milling |
| PLANETARY MILL FRITSCH P5 | High-energy ball milling | Precision milling |
| PLANETARY MILL FRITSCH P6 | High-energy ball milling | Compact, efficient milling |
| RING MILL | Grinding samples to fine powder | Effective for producing fine powders |
| MILLING MACHINE | Precision machining of materials | Versatile machining for various materials |
9. Sample Preparation
| Equipment | Function | Principle |
|---|---|---|
| MICRACUT 125 LOW SPEED PRECISION SAW | Precision cutting of materials | Low-speed precision cutting for minimal damage |
| CUTTER MICRACUT | Cutting materials | General-purpose cutting |
| POLISHING MACHINE METKON | Polishing samples for microscopy | High-quality polishing for microscopy |
| POLISHING MACHINE UNI POL-830 | Polishing samples for microscopy | Advanced polishing with variable speed |
| HOT MOUNTING MACHINE IMPTECH M 10 | Hot mounting samples for microscopy | Compact, efficient hot mounting |
| HOT MOUNTING ECO PRESS 100 | Hot mounting samples for microscopy | Eco-friendly, efficient mounting |
| POLISHING MACHINE IMPTECH | Polishing samples for microscopy | Versatile polishing machine |
| POLISHING MACHINE MINITECH Z63 | Polishing samples for microscopy | Advanced polishing for detailed analysis |
| ABRASIVE CUTTER | Cutting materials with abrasive wheels | Suitable for hard materials |
| DIAMOND CUTTER | Precision cutting using diamond blades | High-precision cutting for hard materials |
10. Auxiliary Equipment
| Equipment | Function | Principle |
|---|---|---|
| ULTRASONIC CLEANER SONO-SWISS | Ultrasonic cleaning of samples | High-frequency cleaning for delicate samples |
| OVEN | Heating and drying samples | Standard drying and heating |
| DIGITAL BALANCE | Weighing samples | High-precision weighing |
| TOP PAN BALANCE | Weighing samples | Suitable for larger samples |
| CENTRIFUGE ROTOFIX 32 A | Centrifugation for sample separation | Efficient sample separation |
| CENTRIFUGE, KUBOTA, 2010 | Centrifugation for sample separation | Versatile centrifuge for various applications |
| OVERHEAD SHAKER, HEIDOLPH, REAX 2 | Shaking samples for mixing | Efficient mixing |
| MICROBALANCE (MAX 5.1G), SARTORIOUS, MC 5 | High-precision weighing of small samples | Extremely high-precision weighing |
| ORBITAL SHAKER, SCILOGEX, SCI-O330-PRO | Orbital shaking for sample mixing | Effective orbital mixing |